Download PDF by Von Hardenberg C.: Bare-hand human-computer interaction

By Von Hardenberg C.

Show description

Read Online or Download Bare-hand human-computer interaction PDF

Similar electronics: radio books

Get Marie Curie and the science of radioactivity PDF

Examines the lifetime of the Polish-born scientist who, together with her husband Pierre, used to be offered a 1903 Nobel Prize for locating radium.

Rick Sturdivant's Transmit Receive Modules for Radar and Communication Systems PDF

Using electronically scanned phased arrays is expanding in structures equivalent to radar, instant networks, and satellite tv for pc flooring terminals. a tremendous and valuable part for those structures is the transmit obtain (T/R) module, which gives the amplification and digital beam guidance that's required for correct functionality.

Extra info for Bare-hand human-computer interaction

Sample text

13 Typical burn-in probe marks. In general, the greater the distance between pads, the more skid there will be. The greatest distance is across the wafer from one side to the other. The outer pads therefore need to be the largest. Since all die on the wafer are usually the same, it forces large pads on all die. The bigger the wafer, the bigger the pads need to be. While the CTE mismatch applies to bumped wafers as well, the greater pitch usually allows for larger pads. The skid, if any, will then not be as much of a problem.

Cheng, S. Mahadevan, and R. Press, “Achieving high test quality with reduced pin count testing,” in Proceedings of Asian Test Symposium, 2005, pp. 312–317. [48] T. G. Foote, D. E. Hoffman, W. V. Huott, T. J. Koprowski, M. P. Kusko, and B. J. Robbins, “Testing the 500-MHz IBM S/390 Microprocessor,” IEEE Design & Test of Computers, vol. 15, no. 3, pp. 83–89, 1998. Introduction 23 [49] B. Koupal, T. Lee and B. pdf. [50] C. Pan and K. Cheng, “Pseudo-random testing and signature analysis for mixed-signal circuits,” Proceedings of International Conference on Computer Aided Design, 1995, pp.

57] W. R. Daasch, K. Cota, J. McNames, and R. Madge, “Neighbor selection for variance reduction in IDDQ and other parametric data,” in Proceedings of International Test Conference, 2001, pp. 1240–1249. [58] S. Sabade and D. M. H. Walker, “Improved wafer-level spatial analysis for IDDQ limit setting,” Proceedings of International Test Conference, 2001, pp. 82–91. [59] A. Keshavarzi, K. Roy, C. F. Hawkins, and V. De, “Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ,” IEEE Transactions on VLSI Systems, vol.

Download PDF sample

Bare-hand human-computer interaction by Von Hardenberg C.

by Edward

Rated 4.67 of 5 – based on 24 votes